Structured Highlight Inspection of Specular Surfaces

Arthur C. Sanderson, Lee Weiss, and S. K. Nayar
IEEE Trans. Pattern Analysis and Machine Intellignece, Vol. 10, No. 1, January, 1988, pp. 44 - 55.


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Abstract
An approach to illumination and imaging of specular surfaces that yields three-dimensional shape information is described. The structured highlight approach uses a scanned array of point sources and images of the resulting reflected highlights to compute local surface height and orientation. A prototype structured highlight inspection system, called SHINY, has been implemented. SHINY demonstrates the determination of surface shape for several test objects including solder joints. The current SHINY system makes the distant-source assumption and requires only one camera. A stereo structured highlight system using two cameras is proposed to determine surface-element orientation for objects in a much larger field of view. Analysis and description of the algorithms are included. The proposed structured highlight techniques are promising for many industrial tasks.

Notes

Text Reference
Arthur C. Sanderson, Lee Weiss, and S. K. Nayar, "Structured Highlight Inspection of Specular Surfaces," IEEE Trans. Pattern Analysis and Machine Intellignece, Vol. 10, No. 1, January, 1988, pp. 44 - 55.

BibTeX Reference
@article{Sanderson_1988_3450,
   author = "Arthur C Sanderson and Lee Weiss and S. K. Nayar",
   title = "Structured Highlight Inspection of Specular Surfaces",
   journal = "IEEE Trans. Pattern Analysis and Machine Intellignece",
   pages = "44 - 55",
   month = "January",
   year = "1988",
   volume = "10",
   number = "1",
}